Keywords

#ellipsometry

Ellipsometry

Optical technique for characterizing thin films

Ellipsometry is an optical technique for investigating the dielectric properties of thin films. Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model.

Wed 6th

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Ellipsometry Polarization (waves) Kramers–Kronig relations Paul Drude Refractive index and extinction coefficient of thin film materials Sufian Tayeh X-ray reflectivity Periodic table Thin-film interference John Woollam (physicist)
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