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#iddq_testing

Iddq testing

Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state. The current consumed in the state is commonly called Iddq for Idd (quiescent) and hence the name.

Sun 18th

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Iddq testing Design for testing Leakage (electronics) Power gating Scan chain Stuck-at fault Power optimization (EDA) PA-7100LC Logic redundancy
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