Keywords

#non-contact_wafer_testing

Non-contact wafer testing

Non contact wafer testing is a normal step in semiconductor device fabrication, used to detect defects in integrated circuits (IC) before they are assembled during the IC packaging step.

Thu 9th

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Non-contact wafer testing Wafer testing Semiconductor device fabrication Lam Research Photolithography Adhesive bonding of semiconductor wafers Heterojunction solar cell Ultrapure water Capacitive displacement sensor Sheet resistance
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