#single-event_upset
Single-event upset
Change of state caused by an ionizing particle
A single-event upset (SEU), also known as a single-event error (SEE), is a change of state caused by one single ionizing particle striking a sensitive node in a live micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The state change is a result of the free charge created by ionization in or close to an important node of a logic element. The error in device output or operation caused as a result of the strike is called an SEU or a soft error.
Wed 31st
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